Title :
Locally constrained diffusion process on locally densified distance spaces with applications to shape retrieval
Author :
Xingwei Yang ; Koknar-Tezel, Suzan ; Latecki, Longin Jan
Author_Institution :
Dept. of Comput. & Inf. Sci., Temple Univ., Philadelphia, PA, USA
Abstract :
The matching and retrieval of 2D shapes is an important challenge in computer vision. A large number of shape similarity approaches have been developed, with the main focus being the comparison or matching of pairs of shapes. In these approaches, other shapes do not influence the similarity measure of a given pair of shapes. In the proposed approach, other shapes do influence the similarity measure of each pair of shapes, and we show that this influence is beneficial even in the unsupervised setting (without any prior knowledge of shape classes). The influence of other shapes is propagated as a diffusion process on a graph formed by a given set of shapes. However, the classical diffusion process does not perform well in shape space for two reasons: it is unstable in the presence of noise and the underlying local geometry is sparse. We introduce a locally constrained diffusion process which is more stable even if noise is present, and we densify the shape space by adding synthetic points we call ´ghost points´. We present experimental results that demonstrate very significant improvements over state-of-the-art shape matching algorithms. On the MPEG-7 data set, we obtained a bull´s-eye retrieval score of 93.32%, which is the highest score ever reported in the literature.
Keywords :
image matching; image retrieval; 2D shape matching; 2D shape retrieval; MPEG-7 data set; bulls-eye retrieval score; ghost points; graph; local geometry; locally constrained diffusion process; locally densified distance space; Application software; Computer vision; Diffusion processes; Focusing; Horses; Humans; Information retrieval; MPEG 7 Standard; Noise shaping; Shape measurement;
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
Print_ISBN :
978-1-4244-3992-8
DOI :
10.1109/CVPR.2009.5206844