DocumentCode :
3008449
Title :
Linewidth Enhancement Factor of Semiconductor Lasers: Results from Round-Robin Measurements in COST 288
Author :
Villafranca, Asier ; Lasobras, Javier ; Garces, Ignacio ; Giuliani, Guido ; Donati, Silvano ; Chacinski, Marek ; Schatz, Richard ; Kouloumentas, Christos ; Klonidis, Dimitrios ; Tomkos, Ioannis ; Landais, Pascal ; Escorihuela, Raul ; Rorison, Judy ; Pozo,
Author_Institution :
Univ. of Zaragoza, Cuarte
fYear :
2007
fDate :
6-11 May 2007
Firstpage :
1
Lastpage :
2
Abstract :
Round-robin measurements on the linewidth enhancement factor are carried out within several laboratories participating to EU COST 288 action. The alpha-factor is measured by applying up to 7 different techniques. The obtained results are compared.
Keywords :
semiconductor lasers; COST 288; linewidth enhancement factor; round-robin measurements; semiconductor lasers; Chirp modulation; Costs; Frequency modulation; Laboratories; Laser feedback; Optical feedback; Optical interferometry; Optical modulation; Photonics; Semiconductor lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
Type :
conf
DOI :
10.1109/CLEO.2007.4452795
Filename :
4452795
Link To Document :
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