DocumentCode
3008598
Title
Support Vector Machines in face recognition with occlusions
Author
Hongjun Jia ; Martinez, Ana Milena
Author_Institution
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
fYear
2009
fDate
20-25 June 2009
Firstpage
136
Lastpage
141
Abstract
Support vector machines (SVM) are one of the most useful techniques in classification problems. One clear example is face recognition. However, SVM cannot be applied when the feature vectors defining our samples have missing entries. This is clearly the case in face recognition when occlusions are present in the training and/or testing sets. When k features are missing in a sample vector of class 1, these define an affine subspace of k dimensions. The goal of the SVM is to maximize the margin between the vectors of class 1 and class 2 on those dimensions with no missing elements and, at the same time, maximize the margin between the vectors in class 2 and the affine subspace of class 1. This second term of the SVM criterion will minimize the overlap between the classification hyperplane and the subspace of solutions in class 1, because we do not know which values in this subspace a test vector can take. The hyperplane minimizing this overlap is obviously the one parallel to the missing dimensions. However, this condition is too restrictive, because its solution will generally contradict that obtained when maximizing the margin of the visible data. To resolve this problem, we define a criterion which minimizes the probability of overlap. The resulting optimization problem can be solved efficiently and we show how the global minimum of the error term is guaranteed under mild conditions. We provide extensive experimental results, demonstrating the superiority of the proposed approach over the state of the art.
Keywords
face recognition; image classification; minimisation; probability; support vector machines; SVM; face recognition; hyperplane minimization; image classification problem; margin maximization; occlusion; optimization problem; probability; support vector machine; Algorithm design and analysis; Brightness; Classification algorithms; Computer errors; Face recognition; Feature extraction; Pixel; Support vector machine classification; Support vector machines; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location
Miami, FL
ISSN
1063-6919
Print_ISBN
978-1-4244-3992-8
Type
conf
DOI
10.1109/CVPR.2009.5206862
Filename
5206862
Link To Document