• DocumentCode
    3008598
  • Title

    Support Vector Machines in face recognition with occlusions

  • Author

    Hongjun Jia ; Martinez, Ana Milena

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2009
  • fDate
    20-25 June 2009
  • Firstpage
    136
  • Lastpage
    141
  • Abstract
    Support vector machines (SVM) are one of the most useful techniques in classification problems. One clear example is face recognition. However, SVM cannot be applied when the feature vectors defining our samples have missing entries. This is clearly the case in face recognition when occlusions are present in the training and/or testing sets. When k features are missing in a sample vector of class 1, these define an affine subspace of k dimensions. The goal of the SVM is to maximize the margin between the vectors of class 1 and class 2 on those dimensions with no missing elements and, at the same time, maximize the margin between the vectors in class 2 and the affine subspace of class 1. This second term of the SVM criterion will minimize the overlap between the classification hyperplane and the subspace of solutions in class 1, because we do not know which values in this subspace a test vector can take. The hyperplane minimizing this overlap is obviously the one parallel to the missing dimensions. However, this condition is too restrictive, because its solution will generally contradict that obtained when maximizing the margin of the visible data. To resolve this problem, we define a criterion which minimizes the probability of overlap. The resulting optimization problem can be solved efficiently and we show how the global minimum of the error term is guaranteed under mild conditions. We provide extensive experimental results, demonstrating the superiority of the proposed approach over the state of the art.
  • Keywords
    face recognition; image classification; minimisation; probability; support vector machines; SVM; face recognition; hyperplane minimization; image classification problem; margin maximization; occlusion; optimization problem; probability; support vector machine; Algorithm design and analysis; Brightness; Classification algorithms; Computer errors; Face recognition; Feature extraction; Pixel; Support vector machine classification; Support vector machines; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
  • Conference_Location
    Miami, FL
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-3992-8
  • Type

    conf

  • DOI
    10.1109/CVPR.2009.5206862
  • Filename
    5206862