• DocumentCode
    3008819
  • Title

    Missing Conductivity in the THz Skin-Depth Layer of Metals

  • Author

    Laman, N. ; Grischkowsky, D.

  • Author_Institution
    Oklahoma State Univ., Stillwater
  • fYear
    2007
  • fDate
    6-11 May 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The conductivity of the THz skin-depth layer of Al films in contact with silicon was measured via a parallel plate waveguide. The increase of conductivity at lower temperatures is extremely sensitive to the surface quality.
  • Keywords
    aluminium; metallic thin films; submillimetre wave spectra; Al films; Al-Si; THz skin-depth layer; missing conductivity; parallel plate waveguide; surface quality; Absorption; Conductivity measurement; Optical films; Optical scattering; Optical surface waves; Optical waveguide components; Optical waveguides; Semiconductor films; Surface waves; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-55752-834-6
  • Type

    conf

  • DOI
    10.1109/CLEO.2007.4452816
  • Filename
    4452816
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3008819