Title :
Missing Conductivity in the THz Skin-Depth Layer of Metals
Author :
Laman, N. ; Grischkowsky, D.
Author_Institution :
Oklahoma State Univ., Stillwater
Abstract :
The conductivity of the THz skin-depth layer of Al films in contact with silicon was measured via a parallel plate waveguide. The increase of conductivity at lower temperatures is extremely sensitive to the surface quality.
Keywords :
aluminium; metallic thin films; submillimetre wave spectra; Al films; Al-Si; THz skin-depth layer; missing conductivity; parallel plate waveguide; surface quality; Absorption; Conductivity measurement; Optical films; Optical scattering; Optical surface waves; Optical waveguide components; Optical waveguides; Semiconductor films; Surface waves; Temperature;
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/CLEO.2007.4452816
