• DocumentCode
    3008951
  • Title

    Compactness measure of digital shapes

  • Author

    Lee, Samuel C. ; Wang, Yiming ; Lee, Elisa T.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Oklahoma Univ., Norman, OK, USA
  • fYear
    2004
  • fDate
    38079
  • Firstpage
    103
  • Lastpage
    105
  • Abstract
    This paper presents a method for measuring the compactness of digital shapes, namely, the digital compactness. Unlike analog shapes, boundary of a digital shape (especially for low-resolution image) has measurable width and thus both its perimeter and area may have different measurements using different methods. Furthermore, rotating a digital shape results in changes in its perimeter and area, and thus its digital compactness. The purpose of this paper is to search for a method for measuring the perimeter, area, and compactness of a digital shape so that, for a given analog geometric shape, the difference between its analog compactness and digital compactness is minimized.
  • Keywords
    edge detection; image segmentation; matrix algebra; shape measurement; boundary pixels; boundary-following algorithm; compactness measurement; digital compactness; digital shapes; low-resolution image; region-based shape descriptors; shape boundary; Area measurement; Cities and towns; Electric variables measurement; Euclidean distance; Joining processes; Length measurement; Niobium; Shape measurement; Solids; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Region 5 Conference: Annual Technical and Leadership Workshop, 2004
  • Print_ISBN
    0-7803-8217-X
  • Type

    conf

  • DOI
    10.1109/REG5.2004.1300173
  • Filename
    1300173