• DocumentCode
    3009239
  • Title

    Image processing for CT-assisted reverse engineering and part characterization

  • Author

    Dusaussoy, Nicolas J. ; Cao, Qizhi ; Yancey, Robert N. ; Stanley, James H.

  • Author_Institution
    Adv. Res. & Applications Corp., Sunnyvale, CA, USA
  • Volume
    3
  • fYear
    1995
  • fDate
    23-26 Oct 1995
  • Firstpage
    33
  • Abstract
    Computed tomography (CT) systems have the ability to rapidly and nondestructively produce images of both exterior and interior surfaces and regions. Because CT images are densitometrically accurate, complete morphological and part characterization information can be obtained without need of physical sectioning. CT data can be processed to create computer-aided design (CAD) representations of the part, to extract dimensional measurement, or to detect, size and locate defects. The key image processing steps which are required both for CT-assisted reverse engineering and CT-assisted part characterization are examined. Two desirable characteristics of the underlying image processing algorithms are accuracy of the produced results and the ability to handle large volumetric images of complex parts
  • Keywords
    CAD/CAM; computer aided engineering; computerised tomography; image processing; manufacture; reverse engineering; tomography; CAD representations; CT data; CT-assisted part characterization; CT-assisted reverse engineering; accuracy; complex parts; computed tomography systems; computer-aided design; defects; dimensional measurement; exterior surfaces; image processing; image processing algorithms; interior surfaces; large volumetric images; morphological information; size; Application software; Computed tomography; Data mining; Design automation; Image processing; Image reconstruction; Reverse engineering; Size measurement; Surface morphology; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 1995. Proceedings., International Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-8186-7310-9
  • Type

    conf

  • DOI
    10.1109/ICIP.1995.537573
  • Filename
    537573