DocumentCode :
3009327
Title :
Significance tests for MEG response detection
Author :
Ahmar, Nayef E. ; Wang, Yadong ; Simon, Jonathan Z.
Author_Institution :
Dept. of Electr. & Comput. Eng., Maryland Univ., College Park, MD
fYear :
2005
fDate :
16-19 March 2005
Firstpage :
21
Lastpage :
24
Abstract :
Magnetoencephalography (MEG) is a non-invasive neurophysiological technique with high temporal resolution. Nevertheless, low signal to noise ratio may hamper its fullest capability. Many confidence tests already exist to detect strong responses for signals corrupted by noise, and we have explored their use with experimentally obtained MEG signals. We find that the tests demonstrating the most power are the F-test and Rayleigh´s phase coherence test. Due to the strongly non-Gaussian nature of the MEG noise, from both neural and external perspective, a signal which is purely noise often fails the marginal tests by exceeding the number of false positive allowed. A variation of the tests is suggested that ensures the average false positive for a large number of responses, excited at frequencies different than the frequency of interest, is below any desired threshold. This is implemented for the F-test, Rayleigh´s phase coherence test, and the union of the two
Keywords :
magnetoencephalography; medical signal detection; neurophysiology; F-test; MEG response detection; Rayleigh phase coherence test; confidence tests; high temporal resolution; magnetoencephalography; nonGaussian noise; noninvasive neurophysiological technique; signal to noise ratio; significance tests; 1f noise; Acoustic noise; Frequency modulation; Magnetic field measurement; Magnetic noise; Magnetic separation; Magnetic shielding; Superconducting device noise; Superconducting magnets; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Engineering, 2005. Conference Proceedings. 2nd International IEEE EMBS Conference on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7803-8710-4
Type :
conf
DOI :
10.1109/CNE.2005.1419541
Filename :
1419541
Link To Document :
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