Title :
A security framework for collaborative distributed system control at the device-level
Author :
Xu, Yuefei ; Korba, Larry ; Wang, Lihui ; Hao, Qi ; Shen, Weiming ; Lang, Sherman
Author_Institution :
Inst. for Inf. Technol., Nat. Res. Council of Canada, Ottawa, Ont., Canada
Abstract :
In today´s globalized business world, outsourcing, joint ventures, and cross-border collaborations have led to work environments that are geographically distributed across organizational and national boundaries. There are critical research needs to develop highly secured collaborative work environments and security solutions for deployment, configuration, monitoring, and device control of interoperating services. We present a well-shaped security framework for distributed system control with a focus on device-level system control, monitoring and services reconfiguration in open and dynamic environments. The characteristics of portability, reconfigurability, interoperability, and interchangeability of these new environments are considered as key factors to produce new security risks and challenges. By adopting public key cryptography, software agent and XML binding technologies, the major security problems of authenticity, integrity, confidentiality, and safe execution are addressed in this framework. The core modules for secure task delivery and execution are presented in detail.
Keywords :
XML; data integrity; distributed control; groupware; industrial control; message authentication; open systems; public key cryptography; software agents; XML binding technology; authentication; collaborative distributed system control; data confidentiality; data integrity; device-level control; open system; public key cryptography; services reconfiguration; software agent; system monitoring; Collaborative work; Control systems; Distributed control; International collaboration; Monitoring; National security; Outsourcing; Public key cryptography; Software agents; XML;
Conference_Titel :
Industrial Informatics, 2003. INDIN 2003. Proceedings. IEEE International Conference on
Print_ISBN :
0-7803-8200-5
DOI :
10.1109/INDIN.2003.1300269