DocumentCode :
3010108
Title :
Cell-plate-line and bit-line complementarily sensed (CBCS) architecture for ultra low-power non-destructive DRAMs
Author :
Hamamoto, T. ; Morooka, Y. ; Asakura, M. ; Ozaki, H.
Author_Institution :
ULSI Lab., Mitsubishi Electr. Corp., Itami, Japan
fYear :
1995
fDate :
8-10 June 1995
Firstpage :
79
Lastpage :
80
Abstract :
In order to develop very high density DRAMs, the reduction of memory-array current, accounting for over 80% of total chip current, must be given serious consideration. As the number of activated sense-amplifiers (SAs) increase, the amount of consumed charge on bit-lines (BLs) increases accordingly. This paper describes a novel circuit design, called Cell-Plate-Line and Bit-Line Complementarily Sensed (CBCS) Architecture. Only the selected SA of a whole array is activated, thereby reducing array read/write current to below 1% compared with conventional ones. Furthermore, refresh operation can easily be executed and the array refresh current is reduced to below 50% without loss of the read-out differential signal.
Keywords :
DRAM chips; memory architecture; nondestructive readout; CBCS architecture; bit-line; cell-plate-line; circuit design; complementary sensing; memory-array current; read-out differential signal; refresh current; sense-amplifiers; ultra low-power nondestructive DRAMs; Capacitors; Circuit synthesis; Electrodes; Gold; Laboratories; Page description languages; Random access memory; Signal restoration; Synthetic aperture sonar; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1995. Digest of Technical Papers., 1995 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
0-7800-2599-0
Type :
conf
DOI :
10.1109/VLSIC.1995.520694
Filename :
520694
Link To Document :
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