Integrating VXIbus-based RF test systems

Author

Levy, Malcolm E.

Author_Institution

Racal-Dana Instrum., Irvine, CA, USA

fYear

1991

fDate

24-26 Sep 1991

Firstpage

105

Lastpage

110

Abstract

VXIbus has received widespread acceptance as a means of improving performance and downsizing automatic test and measurement systems. However, there has been some reluctance to adopt it for all applications, particularly high-performance RF and microwave. A complete line of RF products featuring low-noise, highly shielded designs which offer the user a new spectrum of potential VXIbus applications is discussed. The user of high-performance RF test systems can now benefit from the size, speed, versatility, and financial advantages of VXIbus technology. The special areas of concern relating to RF and microwave integration and how VXIbus products can achieve the necessary performance are described

Keywords

automatic test equipment; automatic testing; computer interfaces; electronic equipment testing; microwave measurement; ATE; EMC; RF products; RF test systems; VXIbus; automatic testing; microwave integration; noise; Automatic testing; Circuits; Electromagnetic compatibility; Energy consumption; Instruments; Manufacturing; Radio frequency; Signal generators; Synthesizers; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '91. IEEE Systems Readiness Technology Conference. Improving Systems Effectiveness in the Changing Environment of the '90s, Conference Record.

Conference_Location

Anaheim, CA

Print_ISBN

0-87942-576-8

Type

conf

DOI

10.1109/AUTEST.1991.197534

Filename

197534