Title :
Integrating VXIbus-based RF test systems
Author :
Levy, Malcolm E.
Author_Institution :
Racal-Dana Instrum., Irvine, CA, USA
Abstract :
VXIbus has received widespread acceptance as a means of improving performance and downsizing automatic test and measurement systems. However, there has been some reluctance to adopt it for all applications, particularly high-performance RF and microwave. A complete line of RF products featuring low-noise, highly shielded designs which offer the user a new spectrum of potential VXIbus applications is discussed. The user of high-performance RF test systems can now benefit from the size, speed, versatility, and financial advantages of VXIbus technology. The special areas of concern relating to RF and microwave integration and how VXIbus products can achieve the necessary performance are described
Keywords :
automatic test equipment; automatic testing; computer interfaces; electronic equipment testing; microwave measurement; ATE; EMC; RF products; RF test systems; VXIbus; automatic testing; microwave integration; noise; Automatic testing; Circuits; Electromagnetic compatibility; Energy consumption; Instruments; Manufacturing; Radio frequency; Signal generators; Synthesizers; System testing;
Conference_Titel :
AUTOTESTCON '91. IEEE Systems Readiness Technology Conference. Improving Systems Effectiveness in the Changing Environment of the '90s, Conference Record.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-87942-576-8
DOI :
10.1109/AUTEST.1991.197534
