Simultaneous switch noise modeling for high performance ASIC

Author

Andresen, Bernhard H. ; Martin, Robert C. ; Keeney, Stanley C. ; Schenck, Stephen R. ; Phelps, Ralph W.

Author_Institution

Texas Instrum. Inc., Dallas, TX, USA

fYear

1994

fDate

19-23 Sep 1994

Firstpage

327

Lastpage

330

Abstract

Texas Instruments ASIC Division (TI) has developed a highly accurate and flexible statistical characterization technique using equations to predict output switching noise. A 21-term polynomial equation is described which accurately predicts the number of ground and V_cc pins required for a given design as nonlinear functions of the number of outputs switching simultaneously, the number of active outputs which are not switching, the ground or V_cc noise levels allowed, the package pin inductances and transmission line characteristics of the loads. The accuracy and flexibility of this technique is contrasted with traditional, less sophisticated methods

Keywords

SPICE; application specific integrated circuits; circuit analysis computing; digital integrated circuits; integrated circuit modelling; integrated circuit noise; polynomials; statistical analysis; switching; 21-term polynomial equation; Texas Instruments; high performance ASIC; output switching noise; package pin inductances; simultaneous switch noise modeling; statistical characterization technique; Application specific integrated circuits; Equations; Impedance; Instruments; Noise level; Noise measurement; Pins; Switches; Transmission lines; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC Conference and Exhibit, 1994. Proceedings., Seventh Annual IEEE International

Conference_Location

Rochester, NY

Print_ISBN

0-7803-2020-4

Type

conf

DOI

10.1109/ASIC.1994.404547

Filename

404547