DocumentCode
3010391
Title
Study of nanosilver filled conductive adhesives and pastes for electronics packaging
Author
Telychkina, Oksana ; Boehme, Bjoern ; Heimann, Matthias ; Morris, James E. ; Wolter, Klaus-juergen
Author_Institution
Electron. Packaging Lab., Tech. Univ. Dresden, Dresden, Germany
fYear
2009
fDate
13-17 May 2009
Firstpage
1
Lastpage
6
Abstract
This research deals with the investigation of novel nanosilver filled conductive adhesives and pastes for application in electronics packaging. Compared to conventional soldering-based interconnection technology, electrical conductive adhesives are believed to have the following advantages: finer pitch capability, lower processing temperature requirements, more environmentally friendly than lead-containing solders. The intention of this research is to investigate the application of silver nanoparticles in conductive adhesives and pastes with an objective to improve the desired properties such as electrical conductivity and mechanical stability. Silver has the highest room temperature electrical and thermal conductivity among all metals. It is expected that adhesives with nanosilver will show higher conductivity due to better sintering and that is why the influence of curing temperature on electrical properties of the adhesives and pastes was also investigated. The dependence of resistivity and curing temperatures was shown. Resistivity was measured and compared for different adhesives and pastes: 1) conventional samples without nanoparticles, 2) mixes which contain both micro- and nanoparticles and 3) only with silver nanoparticles.
Keywords
conductive adhesives; curing; electrical resistivity; electronics packaging; nanoparticles; silver; thermal conductivity; Ag; Resistivity; conductive adhesives; curing temperature; electrical conductive adhesives; electronics packaging; mechanical stability; nanosilver; sintering; thermal conductivity; Conductive adhesives; Curing; Electronics packaging; Lead; Mechanical factors; Nanoparticles; Silver; Stability; Temperature; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology, 2009. ISSE 2009. 32nd International Spring Seminar on
Conference_Location
Brno
Print_ISBN
978-1-4244-4260-7
Type
conf
DOI
10.1109/ISSE.2009.5206954
Filename
5206954
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