Design criteria for CAE-to-ATE translation

Author

Benetazzo, L. ; Costella, J. ; Narduzzi, C. ; Offelli, C. ; Rossetto, D.

Author_Institution

Dipartimento di Elettronica e Inf., Padova Univ., Italy

fYear

1991

fDate

24-26 Sep 1991

Firstpage

449

Lastpage

452

Abstract

The development and performance of two translation methods that connect, and integrate the CAE and ATE environments are discussed. The objective is the automatic translation of the information achieved by CAE design simulation procedures into a program that can be directly input to the test equipment for device-under-test (DUT) stimulus and response verification. The authors show how a set of commands for the tester is automatically generated, improving systems integration and robustness in DUT verification

Keywords

CAD/CAM; automatic test equipment; electronic engineering computing; electronic equipment testing; program interpreters; programming environments; ATE environments; CAE design simulation; CAE-to-ATE translation; DUT verification; device-under-test; stimulus and response verification; Analytical models; Automatic control; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computer aided engineering; Logic testing; System testing; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '91. IEEE Systems Readiness Technology Conference. Improving Systems Effectiveness in the Changing Environment of the '90s, Conference Record.

Conference_Location

Anaheim, CA

Print_ISBN

0-87942-576-8

Type

conf

DOI

10.1109/AUTEST.1991.197591

Filename

197591