Title :
A novel concurrent fault simulation method for mixed-signal circuits
Author :
Hou, Junwei ; Kao, William H. ; Chatterjee, Abhijit
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Fault simulation is critical in test development and fault diagnosis for mixed-signal systems. In this paper we present a novel concurrent fault simulation method for analog/digital mixed-signal circuits. A prototype mixed-signal fault simulation system is developed based on two existing digital and analog fault simulators. The key issue of fault list propagation between digital and analog fault simulators is addressed. Our fault simulation method can deal with mixed-signal systems containing asynchronous digital circuits, nonlinear analog devices, and systems with digital/ analog feedback loops. Simulation results for a PLL circuit domesticate the efficiency of this concurrent mixed-signal fault simulation system
Keywords :
circuit feedback; digital simulation; fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; PLL circuit; asynchronous digital circuits; concurrent fault simulation method; fault list propagation; mixed-signal circuits; nonlinear analog devices; test development; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Feedback circuits; Feedback loop; Logic circuits; Phase locked loops; System testing;
Conference_Titel :
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5471-0
DOI :
10.1109/ISCAS.1999.780764
