• DocumentCode
    3011090
  • Title

    A novel concurrent fault simulation method for mixed-signal circuits

  • Author

    Hou, Junwei ; Kao, William H. ; Chatterjee, Abhijit

  • Author_Institution
    Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    36342
  • Firstpage
    448
  • Abstract
    Fault simulation is critical in test development and fault diagnosis for mixed-signal systems. In this paper we present a novel concurrent fault simulation method for analog/digital mixed-signal circuits. A prototype mixed-signal fault simulation system is developed based on two existing digital and analog fault simulators. The key issue of fault list propagation between digital and analog fault simulators is addressed. Our fault simulation method can deal with mixed-signal systems containing asynchronous digital circuits, nonlinear analog devices, and systems with digital/ analog feedback loops. Simulation results for a PLL circuit domesticate the efficiency of this concurrent mixed-signal fault simulation system
  • Keywords
    circuit feedback; digital simulation; fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; PLL circuit; asynchronous digital circuits; concurrent fault simulation method; fault list propagation; mixed-signal circuits; nonlinear analog devices; test development; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Feedback circuits; Feedback loop; Logic circuits; Phase locked loops; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-5471-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1999.780764
  • Filename
    780764