Title :
The implementation of total quality management in a semiconductor manufacturing operation
Author_Institution :
Xerox Microelectron. Center, El Segundo, CA, USA
Abstract :
The author reviews five years of experience in the implementation of total quality management (TQM) in the operation of the silicon wafer fabrication (fab) facility in the Xerox Microelectronics Center (MEC). The basic concepts of TQM and its operational implications are summarized. This is followed by a detailed description of the TQM implementation process in the wafer fab. The implementation process included an organizational system analysis of MEC operations, a restructuring of the wafer fab organization, the formation of a quality council, the launching of a comprehensive education and training program, and the implementation of statistical process control techniques. A cornerstone in the TQM strategy is empowering all employees through participation in problem solving and quality improvement teams, and involvement through an employee suggestion system. The TQM strategy proved to be instrumental in achieving significant improvements in customer satisfaction, employee satisfaction, productivity, profitability, product quality, cost, and delivery. Finally, work in progress towards continuous quality improvement is described, and implementation barriers are discussed
Keywords :
integrated circuit manufacture; management; production control; quality control; statistical process control; training; TQM; Xerox Microelectronics Center; continuous quality improvement; cost; customer satisfaction; delivery; education program; employee satisfaction; employee suggestion system; empowering all employees; implementation; implementation barriers; implementation process; operational implications; organizational system analysis; participation in problem solving; product quality; productivity; profitability; quality council; quality improvement teams; restructuring; semiconductor manufacturing operation; significant improvements; statistical process control techniques; total quality management; training program; wafer fab; wafer fabrication; work in progress; Councils; Customer satisfaction; Educational programs; Fabrication; Instruments; Microelectronics; Problem-solving; Process control; Silicon; Total quality management;
Conference_Titel :
Semiconductor Manufacturing Science Symposium, 1992. ISMSS 1992., IEEE/SEMI International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-0680-5
DOI :
10.1109/ISMSS.1992.197637