DocumentCode :
3011372
Title :
A 10-Bit 200-MS/s digitally-calibrated pipelined ADC using switching opamps
Author :
Fang, Bing-Nan ; Wu, Jieh-Tsorng
Author_Institution :
Department of Electronics Engineering, National Chiao-Tung University, Hsin-Chu, Taiwan
fYear :
2012
fDate :
20-23 May 2012
Firstpage :
1042
Lastpage :
1045
Abstract :
A 10-bit 200-MS/s pipelined ADC was fabricated using a 90 nm CMOS technology. Switching opamps are used to save power. They are designed for high speed and fast turn-on time. Digital background calibration is used to correct the conversion error caused by the low dc gain of the opamps. The ADC consumes 26 mW from a 1.1 V supply. Its measured DNL and INL are +0.98/−0.81 LSB and +1.4/−1.5 LSB respectively. Its measured SNDR and SFDR are 55 dB and 67.2 dB respectively. The chip active area is 0.69 mm2.
Keywords :
CMOS integrated circuits; Calibration; Capacitors; Pipelines; Semiconductor device measurement; Solid state circuits; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul, Korea (South)
ISSN :
0271-4302
Print_ISBN :
978-1-4673-0218-0
Type :
conf
DOI :
10.1109/ISCAS.2012.6271406
Filename :
6271406
Link To Document :
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