• DocumentCode
    3011853
  • Title

    Iris recognition using Ridgelet transform

  • Author

    Arivazhagan, S. ; Priyadharshini, S. Shobana ; Sekar, J. Raja

  • Author_Institution
    Dept. of ECE, Mepco Schlenk Eng. Coll., Sivakasi, India
  • fYear
    2011
  • fDate
    15-17 Dec. 2011
  • Firstpage
    286
  • Lastpage
    290
  • Abstract
    Iris Recognition is a reliable biometric identification system that uses fine textures of the Iris for person identification and verification. This paper presents a novel algorithm for accurate iris recognition using Ridgelet transform. In this work, the pupil and limbic boundaries are detected by using the equation of circle. Canny edge detection scheme is used for iris boundary detection. After that, eyelids are localized via edge detection followed by curve fitting. A rank filter is adopted for eyelash removal and a histogram filter, for tackling the shape irregularity of eyelids. Finally edge fitting is performed to deal with non circular iris boundaries. After edge fitting, Ridgelet transform is applied and Co-occurrence matrix is computed for each sub band for feature extraction. Here, the benchmark database CASIA-IRIS-V3 (Interval) is used for identification and recognition.
  • Keywords
    curve fitting; edge detection; feature extraction; filtering theory; iris recognition; matrix algebra; transforms; CASIA-IRIS-V3; Interval; Ridgelet transform; benchmark database; biometric identification system; canny edge detection scheme; circular iris boundary; co-occurrence matrix; curve fitting; edge fitting; equation of circle; eyelash removal; eyelids; feature extraction; histogram filter; iris boundary detection; iris recognition; limbic boundary; person identification; person verification; pupil; rank filter; shape irregularity; Feature extraction; Image edge detection; Iris; Iris recognition; Wavelet transforms; Biometrics; Iris Recognition; Ridgelet Transform; canny operator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Recent Advancements in Electrical, Electronics and Control Engineering (ICONRAEeCE), 2011 International Conference on
  • Conference_Location
    Sivakasi
  • Print_ISBN
    978-1-4577-2146-5
  • Type

    conf

  • DOI
    10.1109/ICONRAEeCE.2011.6129805
  • Filename
    6129805