DocumentCode :
301205
Title :
Optimization of sensor response functions for colorimetry of reflective and emissive objects
Author :
Wolski, Mark ; Bouman, Charles A. ; Allebach, Jan P. ; Walowit, Eric
Author_Institution :
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
2
fYear :
1995
fDate :
23-26 Oct 1995
Firstpage :
323
Abstract :
This paper describes the design of color filters for a surface color measurement device. The function of the device is to return the XYZ tristimulus vector characterizing the color of the surface. The device is designed to measure emissive as well as reflective surfaces. It uses an internal set of LEDs to illuminate reflective surfaces while characterizing their color under assumed standard illuminants. In the design of the filters, we formulate a nonlinear optimization problem with the goal of minimizing error in the uniform color space CIE L*a*b*. Our optimization criteria employs a technique to retain a linear structure while approximating the true L*a*b* error. In addition, our solution is regularized to account for system noise, filter roughness and filter implementation errors. Experimental results indicate average and worst case device accuracy of 0.27 L*a*b* ΔE units and 1.56 L*a*b* ΔE units for a “system tolerance” of 0.0005
Keywords :
colorimetry; error analysis; minimisation; optical filters; optical variables measurement; XYZ tristimulus vector; color filters; colorimetry; design; emissive objects; emissive surfaces; error minimization; filter implementation errors; filter roughness; linear structure; nonlinear optimization problem; reflective objects; reflective surfaces; sensor response functions; surface color measurement device; system noise; system tolerance; Band pass filters; Colored noise; Design engineering; Electric variables measurement; Energy measurement; Light emitting diodes; Lighting; Linear approximation; Matched filters; Nonlinear filters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 1995. Proceedings., International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-7310-9
Type :
conf
DOI :
10.1109/ICIP.1995.537480
Filename :
537480
Link To Document :
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