• DocumentCode
    3012611
  • Title

    Terahertz apertureless near-field microscopy of a vanadium dioxide thin film

  • Author

    Zhan, Hui ; Hvasta, Michael ; Astley, Victoria ; Deibel, Jason A. ; Mittleman, Daniel M. ; Lim, Y.

  • Author_Institution
    Rice Univ., Houston
  • fYear
    2007
  • fDate
    6-11 May 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We report the application of terahertz apertureless near-field microscopy to vanadium dioxide thin films. We observe an enhancement of the terahertz amplitude due to the metal-insulator transition induced by an applied voltage.
  • Keywords
    metal-insulator transition; near-field scanning optical microscopy; thin films; vanadium compounds; VO2; metal-insulator transition; terahertz amplitude; terahertz apertureless near-field microscopy; vanadium dioxide thin film; Frequency; Metal-insulator structures; Microscopy; Optical films; Optical scattering; Semiconductivity; Temperature; Transistors; Ultrafast optics; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-55752-834-6
  • Type

    conf

  • DOI
    10.1109/CLEO.2007.4453028
  • Filename
    4453028
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3012611