Title :
Microwave dielectric properties of Ca[(Li1/3Nb2/3)1-xTix]O3-δ-Lithium Magnesium Zinc borosilicate ceramic-glass composite for LTCC applications
Author :
George, S. ; Sebastian, M.T.
Author_Institution :
Mater. & Miner. Div., Nat. Inst. for Interdiscipl. Sci. & Technol., Thiruvananthapuram
Abstract :
The Ca[(Li1/3Nb2/3)1-xTix]O3-delta (x=0.2 and 0.25) (CLNT) ceramics with Lithium Magnesium Zinc Borosilicate (LMZBS) glasses were prepared by conventional solid state ceramic route. The crystal structure and microstructure of the glass added and sintered CLNT ceramics were studied using X-ray diffractometer and Scanning electron microscope. The addition of LMZBS glasses improved the densification and lowered the sintering temperature of CLNT ceramics from 1175degC to 900degC without degrading the microwave dielectric properties. The tauf value is tuned by increasing the titanium content in the Ca[(Li1/3Nb2/3)0.8Ti0.2]O3-delta ceramics. The Ca[(Li1/3Nb2/3)0.75Ti0.25]O3-delta ceramics with 12 wt% of LMZBS and sintered at 900degC/4h has epsivtau=28.52, Quxf =11000 GHz and tauf = -3 ppm/degC. This results shows that the Ca[(Li1/3Nb2/3)0.75Ti0.25]O3-delta ceramics with suitable amount of LMZBS glass addition can find application in LTCC based devices.
Keywords :
Q-factor; X-ray diffraction; borosilicate glasses; calcium compounds; ceramics; composite materials; crystal microstructure; densification; lithium compounds; magnesium compounds; microwave materials; permittivity; scanning electron microscopy; sintering; zinc compounds; Ca[(Li0.33Nb0.67)1-xTix]O3-delta-LiMgZnBSiO2Jk; X-ray diffractometer; ceramic-glass composite; crystal structure; densification; dielectric constant; microstructure; microwave dielectric properties; quality factor; scanning electron microscope; sintering; solid state route; temperature 1175 degC; temperature 900 degC; Ceramics; Crystal microstructure; Dielectrics; Glass; Lithium; Magnesium; Niobium; Solid state circuits; X-ray diffraction; Zinc;
Conference_Titel :
Applied Electromagnetics Conference, 2007. AEMC 2007. IEEE
Conference_Location :
Kolkata
Print_ISBN :
978-1-4244-1863-3
Electronic_ISBN :
978-1-4244-1864-0
DOI :
10.1109/AEMC.2007.4638032