DocumentCode
3013825
Title
Quantitative Phase Microscopy by Multi-wavelength Phase-Shifting Interference Microscopy
Author
Warnasooriya, N. ; Kim, M.K.
Author_Institution
Univ. of South Florida Tampa, Tampa
fYear
2007
fDate
6-11 May 2007
Firstpage
1
Lastpage
2
Abstract
The phase-shifting interference microscopy is combined with the multi-wavelength optical phase unwrapping to obtain quantitative phase profiles of microscopic objects without 2 pi discontinuities. Due to broadband light sources, images are less affected by coherent noise.
Keywords
holographic interferometry; phase shifting interferometry; coherent noise; multiwavelength optical phase unwrapping; multiwavelength phase-shifting interference microscopy; quantitative phase microscopy; Holographic optical components; Holography; Interference; Light sources; Noise level; Optical interferometry; Optical microscopy; Optical noise; Phase noise; Physics;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-55752-834-6
Type
conf
DOI
10.1109/CLEO.2007.4453095
Filename
4453095
Link To Document