DocumentCode :
3014126
Title :
Modeling and characterization of CNT-based TSV for high frequency applications
Author :
Kannan, Sukeshwar ; Kim, Bruce ; Gupta, Anurag ; Noh, Seok-Ho ; Li, Li ; Cho, Sang-Bock
Author_Institution :
Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, USA
fYear :
2012
fDate :
20-23 May 2012
Firstpage :
1584
Lastpage :
1589
Abstract :
This paper presents modeling and characterization of CNT-based TSVs for high frequency applications. We have developed an integrated model of CNT-based TSVs by incorporating quantum confinement effects of CNTs along with kinetic inductance phenomenon at high frequencies. Substrate parasitics have been appropriately modeled as monolithic microwave capacitor by resonant line technique using a two-polynomial equation. Different parametric variations in the model have been outlined as case studies. Furthermore, electrical performance and signal integrity analysis on different cases have been used to determine optimized configuration for TSV-based CNTs for radar applications.
Keywords :
Integrated circuit modeling; Mathematical model; Quantum capacitance; Substrates; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul, Korea (South)
ISSN :
0271-4302
Print_ISBN :
978-1-4673-0218-0
Type :
conf
DOI :
10.1109/ISCAS.2012.6271556
Filename :
6271556
Link To Document :
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