• DocumentCode
    3014142
  • Title

    A 1-V high-speed MTCMOS circuit scheme for power-down applications

  • Author

    Shigematsu, S. ; Mutoh, S. ; Matsuya, Y. ; Yamada, J.

  • Author_Institution
    NTT LSI Labs., Atsugi, Japan
  • fYear
    1995
  • fDate
    8-10 June 1995
  • Firstpage
    125
  • Lastpage
    126
  • Abstract
    A new MTCMOS concept is proposed for power-down applications. This concept realises a new circuit scheme to hold data during the power-down period in which the power is not supplied. Low-power, high-speed performance are achieved by separating the holding circuit from the critical path. A scan register has been developed based on this concept. Using this scheme for an LSI chip, 20-MHz operation at 1.0 V and only a few nA standby current was achieved with 0.5-/spl mu/m CMOS technology.
  • Keywords
    CMOS integrated circuits; large scale integration; power integrated circuits; 0.5 micron; 1 V; 20 MHz; LSI chip; critical path; high-speed MTCMOS circuit; holding circuit; low-power electronics; multi-threshold CMOS technology; power-down; scan register; standby current; Automatic testing; CMOS technology; Clocks; Large scale integration; Latches; Leakage current; Logic circuits; MOSFETs; Power supplies; Sleep;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 1995. Digest of Technical Papers., 1995 Symposium on
  • Conference_Location
    Kyoto, Japan
  • Print_ISBN
    0-7800-2599-0
  • Type

    conf

  • DOI
    10.1109/VLSIC.1995.520717
  • Filename
    520717