• DocumentCode
    3014238
  • Title

    Measurement of the near infrared absorption of Ge on Si films by differential spectroscopy

  • Author

    Sorianello, V. ; Perna, A. ; Colace, L. ; Assanto, G. ; Luan, H.C. ; Kimerling, L.C.

  • Author_Institution
    NooEL- Nonlinear Opt. & Optoelectron. Lab., Univ. "Roma Tre", Rome
  • fYear
    2008
  • fDate
    17-19 Sept. 2008
  • Firstpage
    134
  • Lastpage
    136
  • Abstract
    Using a differential method on epitaxially grown Ge films on silicon, we measure the near-infrared absorption and its temperature dependence.
  • Keywords
    elemental semiconductors; germanium; infrared spectra; semiconductor epitaxial layers; silicon; Ge-Si; differential spectroscopy; epitaxial germanium film; near infrared absorption spectra; silicon film; Electromagnetic wave absorption; Infrared spectra; Optical films; Optical receivers; Optical reflection; Photodetectors; Semiconductor films; Spectroscopy; Temperature dependence; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics, 2008 5th IEEE International Conference on
  • Conference_Location
    Cardiff
  • Print_ISBN
    978-1-4244-1769-8
  • Electronic_ISBN
    978-1-4244-1768-1
  • Type

    conf

  • DOI
    10.1109/GROUP4.2008.4638122
  • Filename
    4638122
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3014238