DocumentCode :
301428
Title :
Discovery of high order patterns
Author :
Wong, Andrew K.C. ; Wang, Yang
Author_Institution :
Pattern Anal. & Machine Intelligence Lab., Waterloo Univ., Ont., Canada
Volume :
2
fYear :
1995
fDate :
22-25 Oct 1995
Firstpage :
1142
Abstract :
To uncover qualitative and quantitative patterns in a data set is a challenging task for research in the area of machine learning and data analysis. Due to the complexity of real-world data, high-order (polythetic) patterns or event associations, in addition to first-order class-dependent relationships, have to be acquired. In this paper, we propose a novel method to discover qualitative and quantitative patterns (or event associations) inherent in a data set. It uses the adjusted residual analysis in statistics to test the significance of the occurrence of a pattern candidate against its expectation. To avoid exhaustive search of all possible combinations of primary events, techniques for eliminating impossible pattern candidates have been developed. Test results on artificial and real-world data are discussed towards the end of the paper
Keywords :
data analysis; database management systems; learning systems; pattern recognition; statistical analysis; adjusted residual analysis; data analysis; data set; database; event association discovery; expectation; machine learning; occurrence; polythetic pattern detection; qualitative patterns; quantitative patterns; statistics; Clustering algorithms; Data analysis; Data engineering; Databases; Design engineering; Machine learning; Partitioning algorithms; Pattern analysis; System analysis and design; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man and Cybernetics, 1995. Intelligent Systems for the 21st Century., IEEE International Conference on
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-2559-1
Type :
conf
DOI :
10.1109/ICSMC.1995.537924
Filename :
537924
Link To Document :
بازگشت