Title :
Phase and group birefringence of silicon waveguides
Author :
Pagel, Tino ; Gäde, Sebastian ; Krause, Michael ; Renner, Hagen ; Brinkmeyer, Ernst
Author_Institution :
Tech. Univ. Hamburg, Harburg
Abstract :
Experimental data of phase and group birefringence are presented for numerous SOI waveguides. The measurements are enabled by a novel easily surveyed analysis of the magneto-optic determination method and allow for spatially resolved evaluation.
Keywords :
birefringence; elemental semiconductors; integrated optics; magneto-optical effects; optical waveguides; silicon-on-insulator; SOI waveguides; group birefringence; magneto-optic determination; phase birefringence; silicon-on-insulator; Birefringence; Electromagnetic wave polarization; Electromagnetic waveguides; Magnetic field measurement; Magnetic heads; Magnetooptic effects; Optical waveguides; Silicon; Tellurium; Transfer functions;
Conference_Titel :
Group IV Photonics, 2008 5th IEEE International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1769-8
Electronic_ISBN :
978-1-4244-1768-1
DOI :
10.1109/GROUP4.2008.4638143
