DocumentCode
3014901
Title
Deep micromachining of insulating materials by etching of laterally constrained distributions of ion tracks
Author
Thornell, G. ; Bengtsson, H. ; Spohr, R. ; Van Veldhuizen, E.J. ; Westerberg, L. ; Schweitz, J. Å ; Studer, B. ; Hjort, K.
Author_Institution
Dept. of Mater. Sci., Uppsala Univ., Sweden
fYear
1998
fDate
25-29 Jan 1998
Firstpage
211
Lastpage
217
Abstract
Deep and vertical microstructuring by wet etching of swift heavy ion induced damages (ion tracks) is here performed in materials possessing a less attractive anisotropy or lacking crystallinity, such as single crystalline quartz, mica, glass and polycarbonate. The concept is named micromachining by ion track etching, MITE. Quartz resonator structures are made by uniform irradiation with ions and etching in lithographically defined areas. The latent, i.e., unetched, damage in the remaining structure is shown to be of little significance for the Q-value and thermal behaviour of such resonators. A new scheme, projection MITE, resting on direct patterning by a shaped ion beam to eliminate also this influence is demonstrated. The definition of edges and corners vs. the ion fluence is investigated. The projection MITE allows miniature structures to be etched out of substrates without the need of a deposited and patterned masking material, which is also shown. Furthermore, a first attempt to demonstrate negative and density-projection techniques based on this kind of MITE is made
Keywords
etching; lithography; micromachining; micromechanical resonators; quartz; MITE; Q-value; SiO2; anisotropy; corners; crystallinity; deep micromachining; direct patterning; edges; heavy ion; insulating materials; ion track etching; ion tracks; laterally constrained distributions; lithography; micromachining; projection MITE; quartz resonator structures; thermal behaviour; uniform irradiation; vertical microstructuring; wet etching; Anisotropic magnetoresistance; Crystal microstructure; Crystalline materials; Crystallization; Etching; Glass; Insulation life; Ion beams; Micromachining; Particle tracking;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 1998. MEMS 98. Proceedings., The Eleventh Annual International Workshop on
Conference_Location
Heidelberg
ISSN
1084-6999
Print_ISBN
0-7803-4412-X
Type
conf
DOI
10.1109/MEMSYS.1998.659756
Filename
659756
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