DocumentCode :
3014901
Title :
Deep micromachining of insulating materials by etching of laterally constrained distributions of ion tracks
Author :
Thornell, G. ; Bengtsson, H. ; Spohr, R. ; Van Veldhuizen, E.J. ; Westerberg, L. ; Schweitz, J. Å ; Studer, B. ; Hjort, K.
Author_Institution :
Dept. of Mater. Sci., Uppsala Univ., Sweden
fYear :
1998
fDate :
25-29 Jan 1998
Firstpage :
211
Lastpage :
217
Abstract :
Deep and vertical microstructuring by wet etching of swift heavy ion induced damages (ion tracks) is here performed in materials possessing a less attractive anisotropy or lacking crystallinity, such as single crystalline quartz, mica, glass and polycarbonate. The concept is named micromachining by ion track etching, MITE. Quartz resonator structures are made by uniform irradiation with ions and etching in lithographically defined areas. The latent, i.e., unetched, damage in the remaining structure is shown to be of little significance for the Q-value and thermal behaviour of such resonators. A new scheme, projection MITE, resting on direct patterning by a shaped ion beam to eliminate also this influence is demonstrated. The definition of edges and corners vs. the ion fluence is investigated. The projection MITE allows miniature structures to be etched out of substrates without the need of a deposited and patterned masking material, which is also shown. Furthermore, a first attempt to demonstrate negative and density-projection techniques based on this kind of MITE is made
Keywords :
etching; lithography; micromachining; micromechanical resonators; quartz; MITE; Q-value; SiO2; anisotropy; corners; crystallinity; deep micromachining; direct patterning; edges; heavy ion; insulating materials; ion track etching; ion tracks; laterally constrained distributions; lithography; micromachining; projection MITE; quartz resonator structures; thermal behaviour; uniform irradiation; vertical microstructuring; wet etching; Anisotropic magnetoresistance; Crystal microstructure; Crystalline materials; Crystallization; Etching; Glass; Insulation life; Ion beams; Micromachining; Particle tracking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 1998. MEMS 98. Proceedings., The Eleventh Annual International Workshop on
Conference_Location :
Heidelberg
ISSN :
1084-6999
Print_ISBN :
0-7803-4412-X
Type :
conf
DOI :
10.1109/MEMSYS.1998.659756
Filename :
659756
Link To Document :
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