Title :
Nonlinear properties of Silicon nanocrystals at 1550 nm and their application in slot waveguides
Author :
Spano, R. ; Tartara, L. ; Yu, J. ; Degiorgio, V. ; Jordana, E. ; Fedeli, J.M. ; Sanchis, P. ; Martì, J. ; Pavesi, L.
Author_Institution :
Nanosci. Lab., Univ. di Trento, Trento
Abstract :
The nonlinear refractive index of Silicon nanocrystals was measured by the z-scan technique. The results were used to estimate the magnitude of the self-phase modulation (SPM) effect in slot waveguide structures filled by Silicon nanocrystals.
Keywords :
elemental semiconductors; nanostructured materials; nonlinear optics; optical waveguides; refractive index; self-phase modulation; silicon; Si; nanocrystals; nonlinear properties; nonlinear refractive index; self-phase modulation; slot waveguides; wavelength 1550 nm; Annealing; Nanocrystals; Nonlinear optics; Optical fiber networks; Optical waveguides; Plasma temperature; Refractive index; Scanning probe microscopy; Silicon; Ultrafast optics;
Conference_Titel :
Group IV Photonics, 2008 5th IEEE International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1769-8
Electronic_ISBN :
978-1-4244-1768-1
DOI :
10.1109/GROUP4.2008.4638160
