Title :
Mixed signal DFT/BIST automation using behavioral modeling
Author :
Abdennadher, Salem ; Chauhan, Bharat
Author_Institution :
Intel Corp., Sacramento, CA, USA
Abstract :
One of the hurdles in mixed signal built in self test is automation. This paper presents a robust mixed signal design for test and built in self test library based approach for BIST circuit creation, insertion, verification and test pattern generation that fits into the existing design flow
Keywords :
automatic test pattern generation; built-in self test; design for testability; integrated circuit modelling; mixed analogue-digital integrated circuits; software libraries; behavioral modeling; built in self test; circuit creation; design flow; design for test; library based approach; mixed signal circuits; test pattern generation; verification; Automatic testing; Automation; Built-in self-test; Circuit testing; Counting circuits; Cutoff frequency; Delay lines; Filters; Jitter; Phase locked loops;
Conference_Titel :
Mixed-Signal Design, 2001. SSMSD. 2001 Southwest Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-6742-1
DOI :
10.1109/SSMSD.2001.914953
