DocumentCode
3014976
Title
Mixed signal DFT/BIST automation using behavioral modeling
Author
Abdennadher, Salem ; Chauhan, Bharat
Author_Institution
Intel Corp., Sacramento, CA, USA
fYear
2001
fDate
2001
Firstpage
137
Lastpage
140
Abstract
One of the hurdles in mixed signal built in self test is automation. This paper presents a robust mixed signal design for test and built in self test library based approach for BIST circuit creation, insertion, verification and test pattern generation that fits into the existing design flow
Keywords
automatic test pattern generation; built-in self test; design for testability; integrated circuit modelling; mixed analogue-digital integrated circuits; software libraries; behavioral modeling; built in self test; circuit creation; design flow; design for test; library based approach; mixed signal circuits; test pattern generation; verification; Automatic testing; Automation; Built-in self-test; Circuit testing; Counting circuits; Cutoff frequency; Delay lines; Filters; Jitter; Phase locked loops;
fLanguage
English
Publisher
ieee
Conference_Titel
Mixed-Signal Design, 2001. SSMSD. 2001 Southwest Symposium on
Conference_Location
Austin, TX
Print_ISBN
0-7803-6742-1
Type
conf
DOI
10.1109/SSMSD.2001.914953
Filename
914953
Link To Document