Title :
Remedies for noise degradation due to active Q-Enhancement Circuit
Author :
Noori, Hossein ; Dai, Fa Foster
Author_Institution :
Department of Electrical and Computer Engineering, Auburn University, AL 36849-5201, USA
Abstract :
Noise cancelation characteristic of Capacitive Cross-Coupling (CCC) and Cross-Coupled Transistor Pair (CCTP) circuit configurations to remedy noise degradation caused by active Q-Enhancement Circuit is analyzed theoretically and demonstrated via simulation. Differential common-gate low-noise amplifier (LNA) has been utilized as the reference circuit for this work. The simulation has been carried out using 0.12µm CMOS process. Compared to prior publications, the proposed LNA demonstrated superior noise performance with good linearity and low power consumption.
Keywords :
Circuit topology; Degradation; Integrated circuit modeling; Noise cancellation; Noise figure; Transistors;
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul, Korea (South)
Print_ISBN :
978-1-4673-0218-0
DOI :
10.1109/ISCAS.2012.6271603
