Title :
Large birefringence in SOI layer and its application to polarization-insensitive AWG
Author :
Hirahara, D. ; Sasaki, K. ; Ishii, T. ; Baba, T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Yokohama Nat. Univ., Yokohama
Abstract :
We evaluated a large birefringence of 0.85 in a SOI layer by totally analyzing the measured index and theoretical and experimental dispersion characteristics of Si photonic wires. It was applied to an ultracompact polarization-insensitive AWG.
Keywords :
arrayed waveguide gratings; birefringence; optical dispersion; refractive index; silicon-on-insulator; SOI layer; Si; birefringence; dispersion characteristics; index; photonic wires; ultracompact polarization-insensitive AWG; Arrayed waveguide gratings; Birefringence; Dispersion; Ellipsoids; Optical polarization; Optical refraction; Optical waveguide theory; Optical waveguides; Slabs; Tellurium;
Conference_Titel :
Group IV Photonics, 2008 5th IEEE International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1769-8
Electronic_ISBN :
978-1-4244-1768-1
DOI :
10.1109/GROUP4.2008.4638216
