• DocumentCode
    3015960
  • Title

    Circuit partitioning for efficient logic BIST synthesis

  • Author

    Irion, Alexander ; Kiefer, Gundolf ; Vranken, Harald ; Wunderlich, H.-J.

  • Author_Institution
    Comput. Archit. Lab., Stuttgart Univ., Germany
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    86
  • Lastpage
    91
  • Abstract
    A divide-and-conquer approach using circuit partitioning is presented, which can be used to accelerate logic BIST synthesis procedures. Many BIST synthesis algorithms contain steps with a time complexity which increases more than linearly with the circuit size. By extracting sub-circuits which are almost constant in size, BIST synthesis for very large designs may be possible within linear time. The partitioning approach does nor require any physical modifications of the circuit under test. Experiments show that significant performance improvements can be obtained at the cost of a longer test application time or a slight increase in silicon area for the BIST hardware
  • Keywords
    built-in self test; computational complexity; divide and conquer methods; logic partitioning; logic testing; circuit partitioning; circuit size; divide-and-conquer approach; linear time; logic BIST synthesis; partitioning approach; silicon area; sub-circuits; test application time; time complexity; Built-in self-test; Circuit synthesis; Circuit testing; Costs; Hardware; Integrated circuit testing; Logic circuits; Logic design; Logic testing; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
  • Conference_Location
    Munich
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-0993-2
  • Type

    conf

  • DOI
    10.1109/DATE.2001.915005
  • Filename
    915005