DocumentCode
3015960
Title
Circuit partitioning for efficient logic BIST synthesis
Author
Irion, Alexander ; Kiefer, Gundolf ; Vranken, Harald ; Wunderlich, H.-J.
Author_Institution
Comput. Archit. Lab., Stuttgart Univ., Germany
fYear
2001
fDate
2001
Firstpage
86
Lastpage
91
Abstract
A divide-and-conquer approach using circuit partitioning is presented, which can be used to accelerate logic BIST synthesis procedures. Many BIST synthesis algorithms contain steps with a time complexity which increases more than linearly with the circuit size. By extracting sub-circuits which are almost constant in size, BIST synthesis for very large designs may be possible within linear time. The partitioning approach does nor require any physical modifications of the circuit under test. Experiments show that significant performance improvements can be obtained at the cost of a longer test application time or a slight increase in silicon area for the BIST hardware
Keywords
built-in self test; computational complexity; divide and conquer methods; logic partitioning; logic testing; circuit partitioning; circuit size; divide-and-conquer approach; linear time; logic BIST synthesis; partitioning approach; silicon area; sub-circuits; test application time; time complexity; Built-in self-test; Circuit synthesis; Circuit testing; Costs; Hardware; Integrated circuit testing; Logic circuits; Logic design; Logic testing; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location
Munich
ISSN
1530-1591
Print_ISBN
0-7695-0993-2
Type
conf
DOI
10.1109/DATE.2001.915005
Filename
915005
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