DocumentCode :
3015960
Title :
Circuit partitioning for efficient logic BIST synthesis
Author :
Irion, Alexander ; Kiefer, Gundolf ; Vranken, Harald ; Wunderlich, H.-J.
Author_Institution :
Comput. Archit. Lab., Stuttgart Univ., Germany
fYear :
2001
fDate :
2001
Firstpage :
86
Lastpage :
91
Abstract :
A divide-and-conquer approach using circuit partitioning is presented, which can be used to accelerate logic BIST synthesis procedures. Many BIST synthesis algorithms contain steps with a time complexity which increases more than linearly with the circuit size. By extracting sub-circuits which are almost constant in size, BIST synthesis for very large designs may be possible within linear time. The partitioning approach does nor require any physical modifications of the circuit under test. Experiments show that significant performance improvements can be obtained at the cost of a longer test application time or a slight increase in silicon area for the BIST hardware
Keywords :
built-in self test; computational complexity; divide and conquer methods; logic partitioning; logic testing; circuit partitioning; circuit size; divide-and-conquer approach; linear time; logic BIST synthesis; partitioning approach; silicon area; sub-circuits; test application time; time complexity; Built-in self-test; Circuit synthesis; Circuit testing; Costs; Hardware; Integrated circuit testing; Logic circuits; Logic design; Logic testing; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
ISSN :
1530-1591
Print_ISBN :
0-7695-0993-2
Type :
conf
DOI :
10.1109/DATE.2001.915005
Filename :
915005
Link To Document :
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