DocumentCode :
3016127
Title :
Fabrication of free standing structure using single step electrochemical etching in hydrofluoric acid
Author :
Ohji, H. ; Trimp, P.J. ; French, P.J.
Author_Institution :
Fac. of Electr. Eng., Delft Univ. of Technol., Netherlands
fYear :
1998
fDate :
25-29 Jan 1998
Firstpage :
246
Lastpage :
250
Abstract :
This paper presents a new technique of micromachining using single step electrochemical etching in hydrofluoric acid (HF). The electrochemical etching in HF is known as a technique for porous silicon formation. This etching technique is applied to fabricate 3-D structures in single crystal silicon by a combination of anisotropic and isotropic modes. The diameter of the pore or the width of the trench can be controlled by the current density. First, vertical walls are formed and after desired depth is obtained, current density is increased by adjusting the light intensity. The width of the trenches is increased under the structures without effecting the width of existing trenches. The connection of the trenches can be achieved and free standing beams obtained with only one mask. The free standing beams with height, width and length of 40 μm, 2 μm and 250 μm, respectively, are made of single crystal silicon
Keywords :
electrochemistry; elemental semiconductors; etching; hydrogen compounds; micromechanical devices; silicon; 2 mum; 250 mum; 3-D structures; 40 mum; HF; Si; Si porous formation; anisotropic mode; current density; electrochemical etching; free standing structure; hydrofluoric acid; isotropic modes; light intensity; single step electrochemical etching; vertical walls; Anisotropic magnetoresistance; Current density; Fabrication; Hafnium; Mechanical sensors; Micromachining; Silicon; Surface morphology; Surface treatment; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 1998. MEMS 98. Proceedings., The Eleventh Annual International Workshop on
Conference_Location :
Heidelberg
ISSN :
1084-6999
Print_ISBN :
0-7803-4412-X
Type :
conf
DOI :
10.1109/MEMSYS.1998.659762
Filename :
659762
Link To Document :
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