Characterization of dynamic nonlinearity in ADCs using wavelet networks

Author

Fraz, H. ; Sperlich, R. ; Kenney, J.S.

Author_Institution

Georgia Inst. of Technol., Atlanta, GA, USA

fYear

2009

fDate

20-21 April 2009

Firstpage

1

Lastpage

4

Abstract

Dynamic nonlinear effects in the track-and-hold circuit contribute significantly to distortion in analog-to-digital converters (ADCs). This paper proposes a model for the characterization of non-linear dynamic effects of a T/H-ADC device by employing a mathematical approach based on wavelet networks (WN). Method effectiveness is demonstrated by validating the model on ADS5483, a 16-bit, 135 MSPS ADC from Texas Instruments. The proposed model is able to predict the harmonic distortion of the ADC in the first three Nyquist zones, at all amplitudes ranging from -1 dbFS to -45 dBFS.

Keywords

analogue-digital conversion; harmonic distortion; neural nets; wavelet transforms; 16-bit 135 MSPS ADC; ADS5483 ADC; Nyquist zones; T/H-ADC device; analog-digital converter; dynamic nonlinearity; harmonic distortion; neural networks; track-and-hold circuit; wavelet networks; Circuits; Clocks; Distortion measurement; Frequency; Harmonic distortion; Instruments; Nonlinear dynamical systems; Shape; Switches; Total harmonic distortion; ADC modeling; Dynamic nonlinearity; Wavelet network;

fLanguage

English

Publisher

ieee

Conference_Titel

Wireless and Microwave Technology Conference, 2009. WAMICON '09. IEEE 10th Annual

Conference_Location

Clearwater, FL

Print_ISBN

978-1-4244-4564-6

Electronic_ISBN

978-1-4244-4565-3

Type

conf

DOI

10.1109/WAMICON.2009.5207271

Filename

5207271