• DocumentCode
    3016313
  • Title

    Comparing the Reliability of PLA and Custom Logic Implementations of a QCA Adder

  • Author

    Dysart, Timothy J. ; Kogge, Peter M.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN
  • fYear
    2008
  • fDate
    29-30 Sept. 2008
  • Firstpage
    53
  • Lastpage
    56
  • Abstract
    Assuming that nanoelectronic systems will face a large number of defective devices resulting in numerous computational faults, defect and/or fault tolerance will be necessary in these systems. However, multiple methods exist for providing this tolerance; in particular, many nanoelectronic systems are considering the use of reprogrammable logic or circuit redundancy. One decision point that may aid in determining which approach should be favored is whether the circuits to be implemented are more reliable when they are implemented in custom logic or in a regular logic array such as a PLA. In this paper, we consider the simple case of an adder circuit implemented in both logic types. We consider the use of QCA devices since both regular and custom logic designs are possible with QCA. We show that, when the components used to build each circuit are faulty, custom logic is preferable to regular logic since the component requirements are significantly smaller for custom logic.
  • Keywords
    adders; cellular automata; circuit reliability; fault tolerance; logic design; nanoelectronics; programmable logic arrays; QCA adder; adder circuit; custom logic design; custom logic implementation; defect tolerance; electronic systems; fault tolerance; nanoelectronic systems; programmable logic array; quantum-dot cellular automata devices; regular logic design; reliability; Adders; Circuit faults; Fault tolerant systems; Logic arrays; Logic circuits; Logic devices; Nanoscale devices; Programmable logic arrays; Quantum cellular automata; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test of Nano Devices, Circuits and Systems, 2008 IEEE International Workshop on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    978-0-7695-3379-7
  • Type

    conf

  • DOI
    10.1109/NDCS.2008.20
  • Filename
    4638334