Title :
On the test of microprocessor IP cores
Author :
Corno, F. ; Reorda, M. Sonza ; Squillero, G. ; Violante, M.
Author_Institution :
Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
Abstract :
Testing is a crucial issue in SOC development and production process. A popular solution for SOCs that include microprocessor cores is based on making them execute a test program. Thus, implementing a very attractive BIST solution. This paper describes a method for the generation of effective programs for the self-test of a processor. The method can be partially automated and combines ideas from traditional functional approaches and from the ATPG field. We assess the feasibility and effectiveness of the method by applying it to a 8051 core
Keywords :
automatic test pattern generation; built-in self test; computer testing; industrial property; integrated circuit testing; microprocessor chips; 8051 core; ATPG; BIST; SOC development; effectiveness; feasibility; microprocessor IP cores; self-test; Automatic test pattern generation; Automatic testing; Built-in self-test; Microprocessors; Performance evaluation; Production; Random access memory; Read-write memory; Software testing; Transistors;
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
Print_ISBN :
0-7695-0993-2
DOI :
10.1109/DATE.2001.915026
