Title :
A BIST Technique for Configurable Nanofabric Arrays
Author :
Al-Assadi, Waleed K. ; Joshi, Mandar V. ; Chaudhry, Ghulam M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO
Abstract :
This work proposes a built-in self test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.
Keywords :
built-in self test; logic testing; nanoelectronics; programmable circuits; BIST technique; built-in self test; configurable nanofabric arrays; crossbars; logic synthesis; programmable elements; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Cities and towns; Fault detection; Logic devices; Logic testing; Nanoscale devices; System testing; BIST; Crossbar; Test; configuration; nano;
Conference_Titel :
Design and Test of Nano Devices, Circuits and Systems, 2008 IEEE International Workshop on
Conference_Location :
Cambridge, MA
Print_ISBN :
978-0-7695-3379-7
DOI :
10.1109/NDCS.2008.8
