DocumentCode :
3016859
Title :
Microscopic image classification via ℂWT-based covariance descriptors using Kullback-Leibler distance
Author :
Keskin, Furkan ; Çetin, A. Enis ; Ersahin, Tulin ; Çetin-Atalay, Rengul
Author_Institution :
Dept. of Electr. & Electron. Eng., Bilkent Univ., Ankara, Turkey
fYear :
2012
fDate :
20-23 May 2012
Firstpage :
2079
Lastpage :
2082
Abstract :
In this paper, we present a novel method for classification of cancer cell line images using complex wavelet-based region covariance matrix descriptors. Microscopic images containing irregular carcinoma cell patterns are represented by randomly selected subwindows which possibly correspond to foreground pixels. For each subwindow, a new region descriptor utilizing the dual-tree complex wavelet transform coefficients as pixel features is computed. ℂWT as a feature extraction tool is preferred primarily because of its ability to characterize singularities at multiple orientations, which often arise in carcinoma cell lines, and approximate shift invariance property. We propose new dissimilarity measures between covariance matrices based on Kullback-Leibler (KL) divergence and L2-norm, which turn out to be as successful as the classical KL divergence, but with much less computational complexity. Experimental results demonstrate the effectiveness of the proposed image classification framework. The proposed algorithm outperforms the recently published eigenvalue-based Bayesian classification method.
Keywords :
cancer; cellular biophysics; covariance matrices; feature extraction; image classification; medical image processing; microscopy; wavelet transforms; CWT based covariance descriptors; Kullback-Leibler distance; Kullback-Leibler divergence; L2 norm; cancer cell line images; carcinoma cell patterns; dissimilarity measurement; dual tree complex wavelet transform coefficient; eigenvalue based Bayesian classification; feature extraction; microscopic image classification; shift invariance property; wavelet based region covariance matrix descriptors; Cancer; Continuous wavelet transforms; Covariance matrix; Feature extraction; Microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
ISSN :
0271-4302
Print_ISBN :
978-1-4673-0218-0
Type :
conf
DOI :
10.1109/ISCAS.2012.6271692
Filename :
6271692
Link To Document :
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