DocumentCode :
3016883
Title :
Gate-level design exploiting dual supply voltages for power-driven applications
Author :
Yeh, Chingwei ; Chang, Min-Cheng ; Chang, Shih-Chieh ; Jone, Wen-Bone
Author_Institution :
Dept. of Electr. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
fYear :
1999
fDate :
1999
Firstpage :
68
Lastpage :
71
Abstract :
The advent of portable and high-density devices has made power consumption a critical design concern. In this paper, we address the problem of reducing power consumption via gate-level voltage scaling for those designs that are not under the strictest timing budget. We first use a maximum-weighted independent set formulation for voltage reduction on non-critical parts of the circuit. Then, we use a minimum-weighted separator set formulation to do gate sizing and integrate the sizing procedure with a voltage scaling procedure to enhance power saving on the whole circuit. The proposed methods are evaluated using the MCNC benchmark circuits. An average of 19.12% power reduction over the circuits having only one supply voltage has been achieved
Keywords :
CMOS digital integrated circuits; circuit CAD; circuit complexity; integrated circuit design; low-power electronics; timing; CMOS design; MCNC benchmark circuits; complexity; dual supply voltages; gate sizing; gate-level design; gate-level voltage scaling; maximum-weighted independent set formulation; minimum-weighted separator set formulation; power consumption; power-driven applications; timing slack; voltage reduction; Circuits; Clocks; Degradation; Energy consumption; Low voltage; Particle separators; Permission; Power supplies; Switches; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location :
New Orleans, LA
Print_ISBN :
1-58113-092-9
Type :
conf
DOI :
10.1109/DAC.1999.781233
Filename :
781233
Link To Document :
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