DocumentCode
3016916
Title
Polarization and Phase-Shifting for 3D Scanning of Translucent Objects
Author
Chen, Tongbo ; Lensch, Hendrik P A ; Fuchs, Christian ; Seidel, Hans-Peter
Author_Institution
Max-Planck-Inst. fur Inf., Saarbrucken
fYear
2007
fDate
17-22 June 2007
Firstpage
1
Lastpage
8
Abstract
Translucent objects pose a difficult problem for traditional structured light 3D scanning techniques. Subsurface scattering corrupts the range estimation in two ways: by drastically reducing the signal-to-noise ratio and by shifting the intensity peak beneath the surface to a point which does not coincide with the point of incidence. In this paper we analyze and compare two descattering methods in order to obtain reliable 3D coordinates for translucent objects. By using polarization-difference imaging, subsurface scattering can be filtered out because multiple scattering randomizes the polarization direction of light while the surface reflectance partially keeps the polarization direction of the illumination. The descattered reflectance can be used for reliable 3D reconstruction using traditional optical 3D scanning techniques, such as structured light. Phase-shifting is another effective descattering technique if the frequency of the projected pattern is sufficiently high. We demonstrate the performance of these two techniques and the combination of them on scanning real-world translucent objects.
Keywords
computational geometry; image reconstruction; image resolution; light polarisation; light scattering; optical scanners; 3D translucent object geometry; image resolution; optical 3D scanning phase-shifting; optical 3D scanning polarization; polarization-difference imaging; reliable 3D reconstruction; signal-to-noise ratio; subsurface scattering; surface reflectance; Image reconstruction; Light scattering; Lighting; Optical filters; Optical imaging; Optical polarization; Optical scattering; Reflectivity; Signal to noise ratio; Surface reconstruction;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2007. CVPR '07. IEEE Conference on
Conference_Location
Minneapolis, MN
ISSN
1063-6919
Print_ISBN
1-4244-1179-3
Electronic_ISBN
1063-6919
Type
conf
DOI
10.1109/CVPR.2007.383209
Filename
4270234
Link To Document