DocumentCode :
3016921
Title :
Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings
Author :
Tan, Xiang-Dong ; Shi, C. J Richard ; Lungeanu, Diana ; Lee, Jyh-Chwen ; Yuan, Li-Pen
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
fYear :
1999
fDate :
1999
Firstpage :
78
Lastpage :
83
Abstract :
This paper presents a new method for determining the widths of the power and ground routes in integrated circuits so that the area required by the routes is minimized subject to the reliability constraints. The basic idea is to transform the resulting constrained nonlinear programming problem into a sequence of linear programs. Theoretically, we show that the sequence of linear programs always converges to the optimum solution of the relaxed convex problem. Experimental results demonstrate that the sequence-of-linear-programming method is orders of magnitude faster than the best-known method based on conjugate gradients, with constantly better optimization solutions
Keywords :
VLSI; circuit layout CAD; circuit optimisation; integrated circuit layout; integrated circuit reliability; linear programming; network routing; sequences; CAD tool; VLSI power/ground networks; constrained nonlinear programming problem; ground route width; optimization solutions; power ground route width; relaxed convex problem; reliability-constrained area optimization; route area minimization; sequence of linear programmings; wire segment width; Design automation; Integrated circuit reliability; Linear programming; Network servers; Optimization methods; Permission; Very large scale integration; Voltage; Wire; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location :
New Orleans, LA
Print_ISBN :
1-58113-092-9
Type :
conf
DOI :
10.1109/DAC.1999.781236
Filename :
781236
Link To Document :
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