DocumentCode :
3017104
Title :
On the impact of on-chip inductance on signal nets under the influence of power grid noise
Author :
Chen, Tom
Author_Institution :
Syst. VLSI Technol. Organ., Hewlett-Packard Co., Fort Collins, CO, USA
fYear :
2001
fDate :
2001
Firstpage :
451
Lastpage :
457
Abstract :
It has been well recognized that the impact of on-chip inductance on some critical nets, such as clock nets, is significant and can not be ignored in delay modeling for these nets. However the impact of on-chip inductance on signal nets in general is still not well understood. We present results of analyzing inductive effects on signal nets for ultra-deep submicron technologies. The analysis is based on a Al-based 0.18 μm CMOS process and a Cu-based 0.13 μm CMOS process. The impact of on-chip inductance is shown to be insignificant if we assume a perfect power supply network around the interconnect routes. Otherwise, the impact of on-chip inductance can be significant. Furthermore, the results presented in this paper illustrate the impact of on-chip inductance one would expect from transitioning from an Al-based interconnect technology to a Cu-based interconnect technology
Keywords :
CMOS integrated circuits; VLSI; inductance; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; 0.13 micron; 0.18 micron; CMOS process; clock nets; delay modeling; inductive effects; interconnect routes; on-chip inductance; perfect power supply network; power grid noise; signal nets; ultra-deep submicron technologies; CMOS process; CMOS technology; Clocks; Delay; Inductance; Power grids; Power supplies; Repeaters; System-on-a-chip; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
ISSN :
1530-1591
Print_ISBN :
0-7695-0993-2
Type :
conf
DOI :
10.1109/DATE.2001.915062
Filename :
915062
Link To Document :
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