Title :
Tip-to-Sample Distance Control in Apertureless Near-Field Optical microscopy
Author :
Milner, A.A. ; Zhang, Kaiyin ; Prior, Yehiam
Author_Institution :
Weizmann Inst. of Sci., Rehovot
Abstract :
Novel mode of AFM operation is proposed providing the small, few nanometers tip to sample gap, appropriate for the ANSOM experiments. A set-up open for the run-time adjustments, working at ambient conditions is considered.
Keywords :
near-field scanning optical microscopy; AFM operation; NSOM; apertureless near-field optical microscopy; near-field scanning optical microscopes; run-time adjustments; tip-to-sample distance control; Atom optics; Atomic force microscopy; Force feedback; Force measurement; Optical control; Optical feedback; Optical microscopy; Optical sensors; Probes; Resonance light scattering;
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/CLEO.2007.4453273
