• DocumentCode
    3017114
  • Title

    Tip-to-Sample Distance Control in Apertureless Near-Field Optical microscopy

  • Author

    Milner, A.A. ; Zhang, Kaiyin ; Prior, Yehiam

  • Author_Institution
    Weizmann Inst. of Sci., Rehovot
  • fYear
    2007
  • fDate
    6-11 May 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Novel mode of AFM operation is proposed providing the small, few nanometers tip to sample gap, appropriate for the ANSOM experiments. A set-up open for the run-time adjustments, working at ambient conditions is considered.
  • Keywords
    near-field scanning optical microscopy; AFM operation; NSOM; apertureless near-field optical microscopy; near-field scanning optical microscopes; run-time adjustments; tip-to-sample distance control; Atom optics; Atomic force microscopy; Force feedback; Force measurement; Optical control; Optical feedback; Optical microscopy; Optical sensors; Probes; Resonance light scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-55752-834-6
  • Type

    conf

  • DOI
    10.1109/CLEO.2007.4453273
  • Filename
    4453273
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3017114