Title :
CMOS open defect detection by supply current test
Author :
Hashizume, Masaki ; Ichimiya, Masahiro ; Yotsuyanagi, Hiroyuki ; Tamesada, Takeomi
Author_Institution :
Fac. of Eng., Tokushima Univ., Japan
Abstract :
In this paper, a new test method is proposed for detecting open defects in CMOS ICs. The method is based on supply current of ICs generated by applying time-variable electric field from the outside of the ICs. The feasibility of the test is examined by some experiments. The empirical results promised that, by using the method, open defects in CMOS ICs can be detected by measuring supply current which flows when time-variable electric field is applied
Keywords :
CMOS logic circuits; automatic testing; fault diagnosis; logic testing; CMOS; logic testing; open defect detection; supply current; supply current test; time-variable electric field; Circuit faults; Circuit testing; Current measurement; Current supplies; Electric variables measurement; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Voltage;
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
Print_ISBN :
0-7695-0993-2
DOI :
10.1109/DATE.2001.915071
