DocumentCode
3017365
Title
Flexible and highly sensitive optical polymeric strain gauge
Author
Dattoma, T. ; Grande, M. ; Qualtieri, A. ; Stomeo, T. ; Petruzzelli, V. ; D´Orazio, A. ; De Vittorio, M. ; Rizzi, Francesco
Author_Institution
Center for Biomol. Nanotechnol.@Unile, Ist. Italiano di Tecnol., Arnesano, Italy
fYear
2013
fDate
5-8 Aug. 2013
Firstpage
660
Lastpage
664
Abstract
In this work, the theoretical analysis of an innovative polymeric strain sensor is proposed. In this device, composed of chalcogenide glass (As2S3) stripes, periodically repeated on a substrate of polydimethylsiloxane (PDMS), an applied strain stretches the soft substrate, altering the periodic arrangement of stripes and introducing a variation of the resonant peak of the optical response of the structure. The amount of strain is measured by analyzing the entity of the resonance displacement or intensity in the reflection spectra. In order to realize strain-sensing application, two regimes have been investigated, in dependence of the aperture between two adjacent stripes: large and small aperture. Numerical computations reveal that, for large aperture, this device is characterized by an excellent sensitivity equal to 1.4 nm/nm and by a linear intensity reflection-deformation calibration curve at a fixed wavelength equal to 1.5 μm. Similarly, the device with smaller aperture exhibits a resonance displacement-deformation calibration curve with a sensitivity of approximately 1.33 nm/nm and 1 nm/nm for first and second resonance, respectively.
Keywords
calibration; chalcogenide glasses; deformation; infrared spectra; numerical analysis; optical polymers; strain gauges; strain measurement; strain sensors; As2S3; PDMS substrate; chalcogenide glass stripes; flexible highly sensitive optical polymeric strain gauge; linear intensity reflection-deformation calibration curve; numerical aperture; numerical computations; optical response; periodic arrangement; polydimethylsiloxane substrate; polymeric strain sensor; reflection spectra; resonance displacement; resonance displacement-deformation calibration curve; resonance intensity; soft substrate; strain measurement; strain-sensing application; wavelength 1.5 mum; Apertures; Optical reflection; Optical sensors; Optical variables measurement; Strain; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2013 13th IEEE Conference on
Conference_Location
Beijing
ISSN
1944-9399
Print_ISBN
978-1-4799-0675-8
Type
conf
DOI
10.1109/NANO.2013.6720944
Filename
6720944
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