• DocumentCode
    3017365
  • Title

    Flexible and highly sensitive optical polymeric strain gauge

  • Author

    Dattoma, T. ; Grande, M. ; Qualtieri, A. ; Stomeo, T. ; Petruzzelli, V. ; D´Orazio, A. ; De Vittorio, M. ; Rizzi, Francesco

  • Author_Institution
    Center for Biomol. Nanotechnol.@Unile, Ist. Italiano di Tecnol., Arnesano, Italy
  • fYear
    2013
  • fDate
    5-8 Aug. 2013
  • Firstpage
    660
  • Lastpage
    664
  • Abstract
    In this work, the theoretical analysis of an innovative polymeric strain sensor is proposed. In this device, composed of chalcogenide glass (As2S3) stripes, periodically repeated on a substrate of polydimethylsiloxane (PDMS), an applied strain stretches the soft substrate, altering the periodic arrangement of stripes and introducing a variation of the resonant peak of the optical response of the structure. The amount of strain is measured by analyzing the entity of the resonance displacement or intensity in the reflection spectra. In order to realize strain-sensing application, two regimes have been investigated, in dependence of the aperture between two adjacent stripes: large and small aperture. Numerical computations reveal that, for large aperture, this device is characterized by an excellent sensitivity equal to 1.4 nm/nm and by a linear intensity reflection-deformation calibration curve at a fixed wavelength equal to 1.5 μm. Similarly, the device with smaller aperture exhibits a resonance displacement-deformation calibration curve with a sensitivity of approximately 1.33 nm/nm and 1 nm/nm for first and second resonance, respectively.
  • Keywords
    calibration; chalcogenide glasses; deformation; infrared spectra; numerical analysis; optical polymers; strain gauges; strain measurement; strain sensors; As2S3; PDMS substrate; chalcogenide glass stripes; flexible highly sensitive optical polymeric strain gauge; linear intensity reflection-deformation calibration curve; numerical aperture; numerical computations; optical response; periodic arrangement; polydimethylsiloxane substrate; polymeric strain sensor; reflection spectra; resonance displacement; resonance displacement-deformation calibration curve; resonance intensity; soft substrate; strain measurement; strain-sensing application; wavelength 1.5 mum; Apertures; Optical reflection; Optical sensors; Optical variables measurement; Strain; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2013 13th IEEE Conference on
  • Conference_Location
    Beijing
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4799-0675-8
  • Type

    conf

  • DOI
    10.1109/NANO.2013.6720944
  • Filename
    6720944