DocumentCode :
3017412
Title :
Application-based approach for automatic texture defect recognition on synthetic surfaces
Author :
Niederhöfer, Marcus ; Lohweg, Volker
Author_Institution :
Phoenix Contact GmbH & Co. KG, Blomberg
fYear :
2008
fDate :
15-18 Sept. 2008
Firstpage :
229
Lastpage :
232
Abstract :
Synthetic surfaces, in particular polymer structures, which are used for electronic components, have to be inspected in industrial processes. Polymers show some specific surface characteristics. This a-priori knowledge is useable for the feature extraction of a surface texture and a following classification. The feature extraction is performed by using statistical information, calculated from sum and difference histograms, while the classification is executed by a fuzzy pattern classifier. A defect area can be recognized just on the basis of the tested image and without the need of any further reference learning data. The classification of a defect part is achieved by analyzing the divergence of the extracted feature values from their median related to the inspected area. Surfaces that contain an inconsistent texture will be rejected.
Keywords :
automatic optical inspection; feature extraction; pattern classification; production engineering computing; surface texture; automatic texture defect recognition; electronic components; feature extraction; fuzzy pattern classifier; polymer structures; statistical information; synthetic surfaces; Data mining; Electronic components; Electronics industry; Feature extraction; Histograms; Image recognition; Plastics industry; Polymers; Surface texture; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Technologies and Factory Automation, 2008. ETFA 2008. IEEE International Conference on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-1505-2
Electronic_ISBN :
978-1-4244-1506-9
Type :
conf
DOI :
10.1109/ETFA.2008.4638397
Filename :
4638397
Link To Document :
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