• DocumentCode
    3017665
  • Title

    Substrate effect on single carbon nanotube based infrared sensors

  • Author

    Liangliang Chen ; Ning Xi ; Ruiguo Yang ; Bo Song ; Zhanxin Zhou ; Zhiyong Sun

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
  • fYear
    2013
  • fDate
    5-8 Aug. 2013
  • Firstpage
    250
  • Lastpage
    253
  • Abstract
    Infrared (IR) sensors have been widely used for military and civil industry, while carbon nanotube (CNT) research progresses have been made in recent years. This led to investigation and development of CNT based IR detectors. In this paper, CNT-metal based Schottky barrier structure was designed to detect IR irradiance, and different interfacial layer, including SiO2, parylene-C, Si3N4, quartz, and polyimide, was used under CNT-metal contact to isolate substrate noise. The experimental results have shown that, the polymer based interfacial layer has strong substrate noise reduction on CNT IR sensor. The dark current is less than 0.3 nA under the condition of photocurrent 170 nA, noise at 0.5 nA when CNT-metal contact was fabricated on polyimide polymer due to substrate isolation and noise reduction.
  • Keywords
    Schottky barriers; carbon; carbon nanotubes; infrared detectors; interference suppression; isolation technology; nanofabrication; nanosensors; photoconductivity; polymers; quartz; substrates; C; CNT based IR detector; CNT metal contact fabrication; CNT-metal based Schottky barrier structure; IR irradiance detection; Si3N4; SiO2; civil industry; current 0.5 nA; current 170 nA; dark current; infrared sensor; isolate substrate noise reduction; military industry; polyimide polymer; polymer based interfacial layer; single carbon nanotube; substrate effect; Acoustics; Detectors; Electrodes; Photoconductivity; Polyimides; Resists;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2013 13th IEEE Conference on
  • Conference_Location
    Beijing
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4799-0675-8
  • Type

    conf

  • DOI
    10.1109/NANO.2013.6720955
  • Filename
    6720955