Title :
High efficiency InP solar cells from low toxicity tertiarybutylphosphine and trimethylindium by OMVPE
Author :
Hoffman, Richard W., Jr. ; Fatemi, Navid S. ; Wilt, David M. ; Jenkins, Phillip P. ; Brinker, David J. ; Scheiman, David A.
Author_Institution :
Essential Res. Inc., Cleveland, OH, USA
Abstract :
Large scale manufacture of phosphide based compound semiconductor devices by organo-metallic vapor phase epitaxy (OMVPE) typically requires the use of highly toxic phosphine. Advancements in phosphine substitutes have identified tertiarybutylphosphine (TBP) as an excellent precursor for OMVPE of InP. High quality undoped and doped InP films were grown using TBP and trimethylindium. Impurity doped InP films were achieved utilizing diethylzinc and silane for p-type and n-type respectively. 16% efficient solar cells under air mass zero, one sun intensity were demonstrated with VOC of 871 mV and fill factor of 82.6%. It was shown that TBP could replace phosphine, without adversely affecting device quality in OMVPE deposition of InP, thus significantly reducing toxic gas exposure risk
Keywords :
III-V semiconductors; indium compounds; semiconductor doping; semiconductor epitaxial layers; semiconductor growth; semiconductor materials; semiconductor thin films; solar cells; vapour phase epitaxial growth; 16 percent; 871 mV; InP; InP solar cells; OMVPE; air mass zero; diethylzinc; doped InP films; fill factor; high efficiency; low toxicity tertiarybutylphosphine; one sun intensity; organo-metallic vapor phase epitaxy; silane; toxic gas exposure risk reduction; trimethylindium; undoped InP films; Epitaxial growth; Indium phosphide; Inductors; Large-scale systems; Photovoltaic cells; Semiconductor device manufacture; Semiconductor devices; Semiconductor films; Temperature measurement; Weight control;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.520734