• DocumentCode
    3018020
  • Title

    Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids

  • Author

    Temnov, Vasily V. ; Sokolowski-Tinten, K. ; Zhou, P. ; von der Linde, D.

  • Author_Institution
    Univ. Dortmund, Dortmund
  • fYear
    2007
  • fDate
    6-11 May 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Capabilities of time-resolved interferometry to study ultrafast phenomena in solids are explored by measuring nanometer-scale transient deformations on laser-excited surfaces and ultrafast evolution of small refractive index changes in the bulk of dielectrics.
  • Keywords
    deformation; dielectric materials; high-speed optical techniques; light interferometry; refractive index; surface structure; dielectrics; femtosecond time-resolved imaging interferometry; laser-excited surfaces; nanometer-scale transient deformations; refractive index; ultrafast evolution; ultrafast phenomena; Laser excitation; Optical interferometry; Optical pulses; Optical pumping; Optical refraction; Optical variables control; Probes; Pump lasers; Solids; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-55752-834-6
  • Type

    conf

  • DOI
    10.1109/CLEO.2007.4453315
  • Filename
    4453315
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3018020