Title :
Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids
Author :
Temnov, Vasily V. ; Sokolowski-Tinten, K. ; Zhou, P. ; von der Linde, D.
Author_Institution :
Univ. Dortmund, Dortmund
Abstract :
Capabilities of time-resolved interferometry to study ultrafast phenomena in solids are explored by measuring nanometer-scale transient deformations on laser-excited surfaces and ultrafast evolution of small refractive index changes in the bulk of dielectrics.
Keywords :
deformation; dielectric materials; high-speed optical techniques; light interferometry; refractive index; surface structure; dielectrics; femtosecond time-resolved imaging interferometry; laser-excited surfaces; nanometer-scale transient deformations; refractive index; ultrafast evolution; ultrafast phenomena; Laser excitation; Optical interferometry; Optical pulses; Optical pumping; Optical refraction; Optical variables control; Probes; Pump lasers; Solids; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/CLEO.2007.4453315
