DocumentCode :
3018216
Title :
Model order-reduction of RC(L) interconnect including variational analysis
Author :
Liu, Ying ; Pileggi, Lawrence T. ; Strojwas, Andrzej J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
1999
fDate :
1999
Firstpage :
201
Lastpage :
206
Abstract :
As interconnect feature sizes continue to scale to smaller dimensions, long interconnect can dominate the IC timing performance, but the interconnect parameter variations make it difficult to predict these dominant delay extremes. This paper presents a model order-reduction technique for RLC interconnect circuits that includes variational analysis to capture manufacturing variations. Matrix perturbation theory is combined with dominant-pole-analysis and Krylov-subspace-analysis methods to produce reduced-order models with direct inclusion of statistically independent manufacturing variations. The accuracy of the resulting variational reduced-order models is demonstrated on several industrial examples
Keywords :
distributed parameter networks; integrated circuit interconnections; integrated circuit modelling; linear network analysis; matrix algebra; perturbation techniques; reduced order systems; variational techniques; IC timing performance; Krylov-subspace-analysis methods; RCL interconnect circuits; dominant-pole-analysis; interconnect parameter variations; manufacturing variations; matrix perturbation theory; model order-reduction; variational analysis; variational reduced-order models; Delay; Fluctuations; Integrated circuit interconnections; Manufacturing industries; Manufacturing processes; Permission; RLC circuits; Reduced order systems; Timing; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location :
New Orleans, LA
Print_ISBN :
1-58113-092-9
Type :
conf
DOI :
10.1109/DAC.1999.781312
Filename :
781312
Link To Document :
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